Description
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The Dimension X3D is an Automated Atomic Force Microscope that provides nondestructive, gauge-capable, automated metrology with three-dimensional (X, Y, and Z) in-line characterization of critical dimension (CD) feature shape control. It is designed for critical level control in leading-edge device manufacturing and can gather detailed data on crucial CD elements. The X3D can scan on any material and its AFM technology enables unmatched resolution and repeatability.Documents
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BRUKER
DIMENSION X3D
Verified
CATEGORY
AFM
Last Verified: Over 60 days ago
Key Item Details
Condition:
Used
Operational Status:
Unknown
Product ID:
54745
Wafer Sizes:
Unknown
Vintage:
Unknown
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
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BRUKER
DIMENSION X3D
CATEGORY
AFM
Last Verified: Over 60 days ago
Key Item Details
Condition:
Used
Operational Status:
Unknown
Product ID:
54745
Wafer Sizes:
Unknown
Vintage:
Unknown
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
Description
No descriptionConfiguration
No ConfigurationOEM Model Description
The Dimension X3D is an Automated Atomic Force Microscope that provides nondestructive, gauge-capable, automated metrology with three-dimensional (X, Y, and Z) in-line characterization of critical dimension (CD) feature shape control. It is designed for critical level control in leading-edge device manufacturing and can gather detailed data on crucial CD elements. The X3D can scan on any material and its AFM technology enables unmatched resolution and repeatability.Documents
No documents