Description
Atomic force microscopeConfiguration
No ConfigurationOEM Model Description
Powder X-ray diffractometer (XRD) used for crystal phase identification, structure determination, and crystallite size analysisDocuments
No documents
BRUKER
D500
CATEGORY
X-Ray / XRD / XRF
Last Verified: 18 days ago
Key Item Details
Condition:
Used
Operational Status:
Unknown
Product ID:
155204
Wafer Sizes:
Unknown
Vintage:
Unknown
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
Description
Atomic force microscopeConfiguration
No ConfigurationOEM Model Description
Powder X-ray diffractometer (XRD) used for crystal phase identification, structure determination, and crystallite size analysisDocuments
No documents