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ONTO / RUDOLPH / AUGUST MetaPULSE-III 300
    Description
    MET
    Configuration
    Metal Thickness Measurement
    OEM Model Description
    MetaPULSE-III 300 is designed specifically to meet semiconductor manufacturers' metal thin-film metrology requirements at the 45 nm technology node and beyond. The modular design of the MetaPULSE-III offers Rudolph's patented PULSE Technology.
    Documents

    No documents

    ONTO / RUDOLPH / AUGUST

    MetaPULSE-III 300

    verified-listing-icon

    Verified

    CATEGORY
    Thin Film / Film Thickness

    Last Verified: Over 60 days ago

    Key Item Details
    Condition:

    Used

    Operational Status:

    Unknown

    Product ID:

    75930

    Wafer Sizes:

    12"/300mm

    Vintage:

    Unknown

    Have Additional Questions?
    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    Similar Listings
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    ONTO / RUDOLPH / AUGUST MetaPULSE-III 300

    ONTO / RUDOLPH / AUGUST

    MetaPULSE-III 300

    Thin Film / Film Thickness
    Vintage: 0Condition: Used
    Last Verified30 days ago
    ONTO / RUDOLPH / AUGUST MetaPULSE-III 300

    ONTO / RUDOLPH / AUGUST

    MetaPULSE-III 300

    Thin Film / Film Thickness
    Vintage: 0Condition: Used
    Last VerifiedOver 60 days ago

    ONTO / RUDOLPH / AUGUST

    MetaPULSE-III 300

    verified-listing-icon
    Verified
    CATEGORY
    Thin Film / Film Thickness
    Last Verified: Over 60 days ago
    listing-photo-3f0e49716dca41c491e5226fcfa889e5-https://d2pkkbyngq3xpw.cloudfront.net/moov_media/3.0-assets/photo-coming-soon-small.png
    Key Item Details
    Condition:

    Used

    Operational Status:

    Unknown

    Product ID:

    75930

    Wafer Sizes:

    12"/300mm

    Vintage:

    Unknown

    Have Additional Questions?
    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    Description
    MET
    Configuration
    Metal Thickness Measurement
    OEM Model Description
    MetaPULSE-III 300 is designed specifically to meet semiconductor manufacturers' metal thin-film metrology requirements at the 45 nm technology node and beyond. The modular design of the MetaPULSE-III offers Rudolph's patented PULSE Technology.
    Documents

    No documents

    Similar Listings
    View All
    ONTO / RUDOLPH / AUGUST MetaPULSE-III 300

    ONTO / RUDOLPH / AUGUST

    MetaPULSE-III 300

    Thin Film / Film ThicknessVintage: 0Condition: UsedLast Verified:30 days ago
    ONTO / RUDOLPH / AUGUST MetaPULSE-III 300

    ONTO / RUDOLPH / AUGUST

    MetaPULSE-III 300

    Thin Film / Film ThicknessVintage: 0Condition: UsedLast Verified:Over 60 days ago