Description
No descriptionConfiguration
No ConfigurationOEM Model Description
An advanced automated optical metrology system from n&k Technology designed for non-destructive characterization and monitoring of thin film materials and semiconductor wafersDocuments
No documents
N & K
3300
CATEGORY
Thin Film / Film Thickness
Last Verified: 3 days ago
Key Item Details
Condition:
Used
Operational Status:
Unknown
Product ID:
153189
Wafer Sizes:
Unknown
Vintage:
Unknown
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
Description
No descriptionConfiguration
No ConfigurationOEM Model Description
An advanced automated optical metrology system from n&k Technology designed for non-destructive characterization and monitoring of thin film materials and semiconductor wafersDocuments
No documents