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6" Fab For Sale from Moov - Click Here to Learn More
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KLA SpectraCD-XT
    Description
    Critical dimensions No missing parts Current Wafer size : 12
    Configuration
    No Configuration
    OEM Model Description
    In February 2006, KLA introduced the SpectraCD-XT—our fourth-generation of inline optical CD metrology systems for advanced patterning process control at the 90nm and 65nm nodes. SpectraCD-XT is a non-destructive dedicated CD and profile metrology system built on our high-throughput, production-proven Archer platform. The tool is the only high performance spectroscopic ellipsometry (SE)-based
    Documents

    No documents

    KLA

    SpectraCD-XT

    verified-listing-icon

    Verified

    CATEGORY
    Thin Film / Film Thickness

    Last Verified: Over 60 days ago

    Key Item Details

    Condition:

    Used


    Operational Status:

    Deinstalled


    Product ID:

    107077


    Wafer Sizes:

    8"/200mm, 12"/300mm


    Vintage:

    Unknown


    Have Additional Questions?
    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    Similar Listings
    View All
    KLA SpectraCD-XT

    KLA

    SpectraCD-XT

    Thin Film / Film Thickness
    Vintage: 0Condition: Used
    Last VerifiedOver 60 days ago

    KLA

    SpectraCD-XT

    verified-listing-icon
    Verified
    CATEGORY
    Thin Film / Film Thickness
    Last Verified: Over 60 days ago
    listing-photo-51d0c0b6a39d4eb6a8e1bb2ee3aa34ae-https://d2pkkbyngq3xpw.cloudfront.net/moov_media/3.0-assets/photo-coming-soon-small.png
    Key Item Details

    Condition:

    Used


    Operational Status:

    Deinstalled


    Product ID:

    107077


    Wafer Sizes:

    8"/200mm, 12"/300mm


    Vintage:

    Unknown


    Have Additional Questions?
    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    Description
    Critical dimensions No missing parts Current Wafer size : 12
    Configuration
    No Configuration
    OEM Model Description
    In February 2006, KLA introduced the SpectraCD-XT—our fourth-generation of inline optical CD metrology systems for advanced patterning process control at the 90nm and 65nm nodes. SpectraCD-XT is a non-destructive dedicated CD and profile metrology system built on our high-throughput, production-proven Archer platform. The tool is the only high performance spectroscopic ellipsometry (SE)-based
    Documents

    No documents

    Similar Listings
    View All
    KLA SpectraCD-XT

    KLA

    SpectraCD-XT

    Thin Film / Film ThicknessVintage: 0Condition: UsedLast Verified:Over 60 days ago
    KLA SpectraCD-XT

    KLA

    SpectraCD-XT

    Thin Film / Film ThicknessVintage: 0Condition: UsedLast Verified:Over 60 days ago