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KEITHLEY Quantox 64000
    Description
    No description
    Configuration
    No Configuration
    OEM Model Description
    A non-contact, corona-based silicon and oxide charge monitoring system configured for wafer-to-wafer cassette handling of 200 mm wafers. System measures electrical characteristics such as charge composition, interface quality, dielectric thickness, and charge contamination of semiconductors and dielectric films. Measurements performed with easy to use Windows NT-based software interface. An Offline Recipe Generator and Data Analysis package provides added remote recipe generation and data analysis capabilities.
    Documents

    No documents

    KEITHLEY

    Quantox 64000

    verified-listing-icon

    Verified

    CATEGORY
    Thin Film / Film Thickness

    Last Verified: Over 60 days ago

    Key Item Details

    Condition:

    Used


    Operational Status:

    Unknown


    Product ID:

    111215


    Wafer Sizes:

    Unknown


    Vintage:

    1997


    Have Additional Questions?
    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    Similar Listings
    View All
    KEITHLEY Quantox 64000

    KEITHLEY

    Quantox 64000

    Thin Film / Film Thickness
    Vintage: 1997Condition: Used
    Last VerifiedOver 60 days ago

    KEITHLEY

    Quantox 64000

    verified-listing-icon
    Verified
    CATEGORY
    Thin Film / Film Thickness
    Last Verified: Over 60 days ago
    listing-photo-93ba2a72c18e45ccb926d2537fcd3893-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/75229/93ba2a72c18e45ccb926d2537fcd3893/8075b8a70c3348ea928c435fb99c3f3a_fd8e1954a93c44d6a06d982ae591dbaf_mw.jpeg
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    listing-photo-93ba2a72c18e45ccb926d2537fcd3893-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/75229/93ba2a72c18e45ccb926d2537fcd3893/d4f34d9ff7df4d4b9ea8490091fe96e0_687d50b4a7a54d5ca6a47474c75dcae7_mw.jpeg
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    listing-photo-93ba2a72c18e45ccb926d2537fcd3893-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/75229/93ba2a72c18e45ccb926d2537fcd3893/3dce03247ca942f381dff2ba7152ae3c_3c180fd2d4714786adcbfe99b08ee82a_mw.jpeg
    Key Item Details

    Condition:

    Used


    Operational Status:

    Unknown


    Product ID:

    111215


    Wafer Sizes:

    Unknown


    Vintage:

    1997


    Have Additional Questions?
    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    Description
    No description
    Configuration
    No Configuration
    OEM Model Description
    A non-contact, corona-based silicon and oxide charge monitoring system configured for wafer-to-wafer cassette handling of 200 mm wafers. System measures electrical characteristics such as charge composition, interface quality, dielectric thickness, and charge contamination of semiconductors and dielectric films. Measurements performed with easy to use Windows NT-based software interface. An Offline Recipe Generator and Data Analysis package provides added remote recipe generation and data analysis capabilities.
    Documents

    No documents

    Similar Listings
    View All
    KEITHLEY Quantox 64000

    KEITHLEY

    Quantox 64000

    Thin Film / Film ThicknessVintage: 1997Condition: UsedLast Verified:Over 60 days ago