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6" Fab For Sale from Moov - Click Here to Learn More
6" Fab For Sale from Moov - Click Here to Learn More
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6" Fab For Sale from Moov - Click Here to Learn More
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FSM / FRONTIER SEMICONDUCTOR RAMAN 360
    Description
    No description
    Configuration
    No Configuration
    OEM Model Description
    Micro Raman system for lattice level strain and material composition measurement. High spectral resolution (0.02 cm-1) and sub micron lateral resolution. Measurement of through silicon via (TSV) keep out zone, local stress and composition profiling. Fully automated C2C system.
    Documents

    No documents

    FSM / FRONTIER SEMICONDUCTOR

    RAMAN 360

    verified-listing-icon

    Verified

    CATEGORY
    Thin Film / Film Thickness

    Last Verified: Over 60 days ago

    Key Item Details

    Condition:

    Used


    Operational Status:

    Unknown


    Product ID:

    89292


    Wafer Sizes:

    Unknown


    Vintage:

    Unknown


    Have Additional Questions?
    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    Similar Listings
    View All
    FSM / FRONTIER SEMICONDUCTOR RAMAN 360

    FSM / FRONTIER SEMICONDUCTOR

    RAMAN 360

    Thin Film / Film Thickness
    Vintage: 0Condition: Used
    Last VerifiedOver 60 days ago

    FSM / FRONTIER SEMICONDUCTOR

    RAMAN 360

    verified-listing-icon
    Verified
    CATEGORY
    Thin Film / Film Thickness
    Last Verified: Over 60 days ago
    listing-photo-fd3cb40f99ea4671bdec8e6899976211-https://d2pkkbyngq3xpw.cloudfront.net/moov_media/3.0-assets/photo-coming-soon-small.png
    Key Item Details

    Condition:

    Used


    Operational Status:

    Unknown


    Product ID:

    89292


    Wafer Sizes:

    Unknown


    Vintage:

    Unknown


    Have Additional Questions?
    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    Description
    No description
    Configuration
    No Configuration
    OEM Model Description
    Micro Raman system for lattice level strain and material composition measurement. High spectral resolution (0.02 cm-1) and sub micron lateral resolution. Measurement of through silicon via (TSV) keep out zone, local stress and composition profiling. Fully automated C2C system.
    Documents

    No documents

    Similar Listings
    View All
    FSM / FRONTIER SEMICONDUCTOR RAMAN 360

    FSM / FRONTIER SEMICONDUCTOR

    RAMAN 360

    Thin Film / Film ThicknessVintage: 0Condition: UsedLast Verified:Over 60 days ago