Description
No descriptionConfiguration
No ConfigurationOEM Model Description
Local and Lattice Stress Measurement, Die level Topography. For in-die and in-device stress and composition control.Documents
No documents
FSM / FRONTIER SEMICONDUCTOR
FSM127
Verified
CATEGORY
Thin Film / Film Thickness
Last Verified: Over 60 days ago
Key Item Details
Condition:
Used
Operational Status:
Unknown
Product ID:
89293
Wafer Sizes:
Unknown
Vintage:
Unknown
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
FSM / FRONTIER SEMICONDUCTOR
FSM127
CATEGORY
Thin Film / Film Thickness
Last Verified: Over 60 days ago
Key Item Details
Condition:
Used
Operational Status:
Unknown
Product ID:
89293
Wafer Sizes:
Unknown
Vintage:
Unknown
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
Description
No descriptionConfiguration
No ConfigurationOEM Model Description
Local and Lattice Stress Measurement, Die level Topography. For in-die and in-device stress and composition control.Documents
No documents