Description
No descriptionConfiguration
No ConfigurationOEM Model Description
Local and Lattice Stress Measurement, Die level Topography. For in-die and in-device stress and composition control.Documents
No documents
CATEGORY
Thin Film / Film Thickness
Last Verified: Over 60 days ago
Key Item Details
Condition:
Used
Operational Status:
Unknown
Product ID:
89293
Wafer Sizes:
Unknown
Vintage:
Unknown
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
FSM / FRONTIER SEMICONDUCTOR
FSM127
CATEGORY
Thin Film / Film Thickness
Last Verified: Over 60 days ago
Key Item Details
Condition:
Used
Operational Status:
Unknown
Product ID:
89293
Wafer Sizes:
Unknown
Vintage:
Unknown
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
Description
No descriptionConfiguration
No ConfigurationOEM Model Description
Local and Lattice Stress Measurement, Die level Topography. For in-die and in-device stress and composition control.Documents
No documents