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FSM / FRONTIER SEMICONDUCTOR FSM 413
    Description
    Wafer thickness measurement system
    Configuration
    No Configuration
    OEM Model Description
    The FSM 413 by Frontier Semiconductor (FSM) is a specialized dimensional and topography metrology measurement system designed for non-contact wafer thickness and thin-film metrology.
    Documents

    No documents

    FSM / FRONTIER SEMICONDUCTOR

    FSM 413

    verified-listing-icon

    Verified

    CATEGORY
    Thin Film / Film Thickness

    Last Verified: 4 days ago

    Key Item Details
    Condition:

    Used

    Operational Status:

    Unknown

    Product ID:

    153161

    Wafer Sizes:

    Unknown

    Vintage:

    Unknown

    Logistics Support
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    Similar Listings
    View All
    FSM / FRONTIER SEMICONDUCTOR FSM 413

    FSM / FRONTIER SEMICONDUCTOR

    FSM 413

    Thin Film / Film Thickness
    Vintage: 0Condition: Used
    Last Verified4 days ago

    FSM / FRONTIER SEMICONDUCTOR

    FSM 413

    verified-listing-icon
    Verified
    CATEGORY
    Thin Film / Film Thickness
    Last Verified: 4 days ago
    listing-photo-fb30aa95e50c4fd4990b4cbc5ab63db8-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/1079/fb30aa95e50c4fd4990b4cbc5ab63db8/4f188270ebcc442e9c4951ed584e9ac9_a4d0bebe44eb1c798a4f3087c8bf323e3c3306mv2d25601440s2_mw.jpg
    listing-photo-fb30aa95e50c4fd4990b4cbc5ab63db8-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/1079/fb30aa95e50c4fd4990b4cbc5ab63db8/8baa20f6741b4a1799168a54bf177e84_a4d0be7f5b6fd2444143c1bbf8cf2f39061a40mv2d25601440s2_mw.jpg
    listing-photo-fb30aa95e50c4fd4990b4cbc5ab63db8-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/1079/fb30aa95e50c4fd4990b4cbc5ab63db8/30860941a94c48bda0626008943e0e83_a4d0beea839dab741341dd8b3ffdc97e049122mv2d25601440s2_mw.jpg
    Key Item Details
    Condition:

    Used

    Operational Status:

    Unknown

    Product ID:

    153161

    Wafer Sizes:

    Unknown

    Vintage:

    Unknown

    Logistics Support
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    Description
    Wafer thickness measurement system
    Configuration
    No Configuration
    OEM Model Description
    The FSM 413 by Frontier Semiconductor (FSM) is a specialized dimensional and topography metrology measurement system designed for non-contact wafer thickness and thin-film metrology.
    Documents

    No documents

    Similar Listings
    View All
    FSM / FRONTIER SEMICONDUCTOR FSM 413

    FSM / FRONTIER SEMICONDUCTOR

    FSM 413

    Thin Film / Film ThicknessVintage: 0Condition: UsedLast Verified:4 days ago