Description
Thin Film Measurement SystemConfiguration
No ConfigurationOEM Model Description
F20s are general-purpose film thickness measurement instruments, and are used in thousands of applications worldwide. Thickness and refractive index can be measured in less than a second. Like all of our thickness measurement instruments, the F20 connects to the USB port of your Windows® computer and sets up in minutes. Thickness Range: 1nm - 250µm Wavelength Range: 190-1700nmDocuments
No documents
Verified
CATEGORY
Thin Film / Film Thickness
Last Verified: 23 days ago
Key Item Details
Condition:
Used
Operational Status:
Unknown
Product ID:
137406
Wafer Sizes:
8"/200mm
Vintage:
Unknown
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
KLA / FILMETRICS
F20-UVX
CATEGORY
Thin Film / Film Thickness
Last Verified: 23 days ago
Key Item Details
Condition:
Used
Operational Status:
Unknown
Product ID:
137406
Wafer Sizes:
8"/200mm
Vintage:
Unknown
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
Description
Thin Film Measurement SystemConfiguration
No ConfigurationOEM Model Description
F20s are general-purpose film thickness measurement instruments, and are used in thousands of applications worldwide. Thickness and refractive index can be measured in less than a second. Like all of our thickness measurement instruments, the F20 connects to the USB port of your Windows® computer and sets up in minutes. Thickness Range: 1nm - 250µm Wavelength Range: 190-1700nmDocuments
No documents