
Description
Film Thickness Measurement SystemConfiguration
No ConfigurationOEM Model Description
The F10-RT reflectometer captures reflectance and transmittance spectra with a single mouse-click. For a fraction of the price of legacy reflectometry systems, users can measure min/max and color. Thickness Range: 15nm - 70µm Wavelength Range: 380-1050nmDocuments
No documents
Verified
CATEGORY
Thin Film / Film Thickness
Last Verified: 19 days ago
Key Item Details
Condition:
Used
Operational Status:
Unknown
Product ID:
147706
Wafer Sizes:
6"/150mm
Vintage:
Unknown
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
KLA / FILMETRICS
F10-RT
CATEGORY
Thin Film / Film Thickness
Last Verified: 19 days ago
Key Item Details
Condition:
Used
Operational Status:
Unknown
Product ID:
147706
Wafer Sizes:
6"/150mm
Vintage:
Unknown
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
Description
Film Thickness Measurement SystemConfiguration
No ConfigurationOEM Model Description
The F10-RT reflectometer captures reflectance and transmittance spectra with a single mouse-click. For a fraction of the price of legacy reflectometry systems, users can measure min/max and color. Thickness Range: 15nm - 70µm Wavelength Range: 380-1050nmDocuments
No documents