Description
Comes with the Software, Does not come with the computer. You can use any computer to run the software.Configuration
F50-UV - Thin-Film Mapping System (Requires Separate Chuck, Up to 300mm), 200-1100nm Version F50 Chuck-200mm - (200-0088) F50 Wafer Chuck Assembly for 4", 5", 6" & 200mm wafersOEM Model Description
The Filmetrics F50 is an automated thin-film thickness mapping system equipped with a motorized r-theta stage that moves automatically to selected measurement points and provides thickness measurements as fast as two points per second. The system is capable of mapping wafers using predefined polar, rectangular or linear map patterns with center or edge exclusion. The F50 film thickness mapping system connects to the USB port of your Windows® computer and can be set up in minutes.Documents
No documents
KLA / FILMETRICS
F50
Verified
CATEGORY
Thin Film / Film Thickness
Last Verified: Over 60 days ago
Key Item Details
Condition:
Used
Operational Status:
Unknown
Product ID:
81974
Wafer Sizes:
4"/100mm, 6"/150mm, 8"/200mm, 12"/300mm
Vintage:
Unknown
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
KLA / FILMETRICS
F50
CATEGORY
Thin Film / Film Thickness
Last Verified: Over 60 days ago
Key Item Details
Condition:
Used
Operational Status:
Unknown
Product ID:
81974
Wafer Sizes:
4"/100mm, 6"/150mm, 8"/200mm, 12"/300mm
Vintage:
Unknown
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
Description
Comes with the Software, Does not come with the computer. You can use any computer to run the software.Configuration
F50-UV - Thin-Film Mapping System (Requires Separate Chuck, Up to 300mm), 200-1100nm Version F50 Chuck-200mm - (200-0088) F50 Wafer Chuck Assembly for 4", 5", 6" & 200mm wafersOEM Model Description
The Filmetrics F50 is an automated thin-film thickness mapping system equipped with a motorized r-theta stage that moves automatically to selected measurement points and provides thickness measurements as fast as two points per second. The system is capable of mapping wafers using predefined polar, rectangular or linear map patterns with center or edge exclusion. The F50 film thickness mapping system connects to the USB port of your Windows® computer and can be set up in minutes.Documents
No documents