Description
Thickness range: 15nm - 70µm Wavelength range: 380-1050nm Simultaneous measurement of thickness and refractive indexConfiguration
-The film thickness measurement. -Working condition. -Vintage 2021 -No missing parts and include calibration wafer.OEM Model Description
The F20 Series are general-purpose film thickness measurement instruments used in thousands of applications worldwide. Thickness and refractive index can be measured in less than a second. The F20 connects to the USB port of your Windows® computer and sets up in minutes. The different F20 instruments are distinguished primarily by the thickness measurement range, which in turn is determined by the instrument’s wavelength range.Documents
No documents
KLA / FILMETRICS
F20
Verified
CATEGORY
Thin Film / Film Thickness
Last Verified: Over 60 days ago
Key Item Details
Condition:
Used
Operational Status:
Unknown
Product ID:
65744
Wafer Sizes:
Unknown
Vintage:
2021
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
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KLA / FILMETRICS
F20
CATEGORY
Thin Film / Film Thickness
Last Verified: Over 60 days ago
Key Item Details
Condition:
Used
Operational Status:
Unknown
Product ID:
65744
Wafer Sizes:
Unknown
Vintage:
2021
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
Description
Thickness range: 15nm - 70µm Wavelength range: 380-1050nm Simultaneous measurement of thickness and refractive indexConfiguration
-The film thickness measurement. -Working condition. -Vintage 2021 -No missing parts and include calibration wafer.OEM Model Description
The F20 Series are general-purpose film thickness measurement instruments used in thousands of applications worldwide. Thickness and refractive index can be measured in less than a second. The F20 connects to the USB port of your Windows® computer and sets up in minutes. The different F20 instruments are distinguished primarily by the thickness measurement range, which in turn is determined by the instrument’s wavelength range.Documents
No documents