Description
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The Nanometrics NanoSpec AFT 210 VT is a computerized, optical non-contact thin-film thickness measurement system used primarily in semiconductor manufacturing and cleanrooms.Documents
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CATEGORY
Thin Film / Film Thickness
Last Verified: 4 days ago
Key Item Details
Condition:
Used
Operational Status:
Unknown
Product ID:
154332
Wafer Sizes:
Unknown
Vintage:
Unknown
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
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ONTO / NANOMETRICS / ACCENT / BIO-RAD
NanoSpec AFT 210 VT
CATEGORY
Thin Film / Film Thickness
Last Verified: 4 days ago
Key Item Details
Condition:
Used
Operational Status:
Unknown
Product ID:
154332
Wafer Sizes:
Unknown
Vintage:
Unknown
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
Description
No descriptionConfiguration
No ConfigurationOEM Model Description
The Nanometrics NanoSpec AFT 210 VT is a computerized, optical non-contact thin-film thickness measurement system used primarily in semiconductor manufacturing and cleanrooms.Documents
No documents