Description
METROLOGYConfiguration
8300 XSEOEM Model Description
The NanoSpec 8300 is a film thickness measuring system designed by Nanometrics for the semiconductor industry. It is capable of handling both 200mm and 300mm diameter wafers. The system incorporates both a spectroscopic ellipsometer and spectrophotometer, enabling it to accurately measure and analyze virtually any dielectric film used in semiconductor manufacture today.Documents
No documents
CATEGORY
Thin Film / Film Thickness
Last Verified: 17 days ago
Key Item Details
Condition:
Used
Operational Status:
Unknown
Product ID:
149426
Wafer Sizes:
8"/200mm, 12"/300mm
Vintage:
Unknown
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
ONTO / NANOMETRICS / ACCENT / BIO-RAD
NANOSPEC 8300
CATEGORY
Thin Film / Film Thickness
Last Verified: 17 days ago
Key Item Details
Condition:
Used
Operational Status:
Unknown
Product ID:
149426
Wafer Sizes:
8"/200mm, 12"/300mm
Vintage:
Unknown
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
Description
METROLOGYConfiguration
8300 XSEOEM Model Description
The NanoSpec 8300 is a film thickness measuring system designed by Nanometrics for the semiconductor industry. It is capable of handling both 200mm and 300mm diameter wafers. The system incorporates both a spectroscopic ellipsometer and spectrophotometer, enabling it to accurately measure and analyze virtually any dielectric film used in semiconductor manufacture today.Documents
No documents