Description
Critical Dimension (CD) Measurement (non SEM)Configuration
No ConfigurationOEM Model Description
The Atlas III, Atlas II+, and Atlas XP/Atlas XP+ line of high-performance metrology systems providing optical critical dimension (“OCD”®), thin film metrology and wafer stress for transistor and interconnect metrology applications.Documents
No documents
CATEGORY
Thin Film / Film Thickness
Last Verified: 19 days ago
Key Item Details
Condition:
Used
Operational Status:
Unknown
Product ID:
147775
Wafer Sizes:
12"/300mm
Vintage:
Unknown
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
ONTO / NANOMETRICS / ACCENT / BIO-RAD
ATLAS III
CATEGORY
Thin Film / Film Thickness
Last Verified: 19 days ago
Key Item Details
Condition:
Used
Operational Status:
Unknown
Product ID:
147775
Wafer Sizes:
12"/300mm
Vintage:
Unknown
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
Description
Critical Dimension (CD) Measurement (non SEM)Configuration
No ConfigurationOEM Model Description
The Atlas III, Atlas II+, and Atlas XP/Atlas XP+ line of high-performance metrology systems providing optical critical dimension (“OCD”®), thin film metrology and wafer stress for transistor and interconnect metrology applications.Documents
No documents