ULTRASCAN 9600
Category
Thin Film / Film ThicknessOverview
UltraScan Wafer Metrology System The 9600 and 9650 systems, introduced in 1994 and based on the more advanced E-Plus station, measure thickness down to an accuracy of 0.25 microns.
Active Listings
0
Services
Inspection, Insurance, Appraisal, Logistics
Top Listings
- No products found