We value your privacy
We and our selected partners use cookies to enhance your browsing experience, serve personalized content, and analyze our traffic. By clicking "Accept All", you consent to our use of cookies. Read More
AFS-3220 FA
Category
Thin Film / Film ThicknessOverview
Wafer flatness measurements to 90nm line widths, 200mm/300mm, SOI and bare wafer capability. Measures thickness of wafers by electrical capacitance.
Active Listings
0
Services
Inspection, Insurance, Appraisal, Logistics
Top Listings
- No products found