Description
FEI Tecnai G2 F30 TWIN 300kV FEG TEMConfiguration
– FEI Tecnai G2 F30 TWIN 300 kV FEG Transmission Electron Microscope – Suitable for materials science, nanomaterials, and life sciences ** BEAM ** – Field emission gun (FEG) – Acceleration voltage: 300 kV ** RESOLUTION ** – Point resolution: 0.24 nm – Line resolution: 0.14 nm ** DETECTORS ** – Gatan UltraScan 4000 UHS MP (multi-port readout) for 300 kV ** STAGE ** – Single-tilt holder – Single-tilt tomography holder – Double-tilt holder – Five-axis motorized goniometer stage – Typical tilt range up to ±70 degrees with tomography holderOEM Model Description
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TECNAI
F20
CATEGORY
TEM
Last Verified: 12 days ago
Key Item Details
Condition:
Used
Operational Status:
Unknown
Product ID:
147194
Wafer Sizes:
Unknown
Vintage:
2002
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
Description
FEI Tecnai G2 F30 TWIN 300kV FEG TEMConfiguration
– FEI Tecnai G2 F30 TWIN 300 kV FEG Transmission Electron Microscope – Suitable for materials science, nanomaterials, and life sciences ** BEAM ** – Field emission gun (FEG) – Acceleration voltage: 300 kV ** RESOLUTION ** – Point resolution: 0.24 nm – Line resolution: 0.14 nm ** DETECTORS ** – Gatan UltraScan 4000 UHS MP (multi-port readout) for 300 kV ** STAGE ** – Single-tilt holder – Single-tilt tomography holder – Double-tilt holder – Five-axis motorized goniometer stage – Typical tilt range up to ±70 degrees with tomography holderOEM Model Description
None ProvidedDocuments
No documents