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JEOL JEM-3010
    Description
    No description
    Configuration
    No Configuration
    OEM Model Description
    The JEM-3010 is an ultrahigh resolution analytical electron microscope that boasts a point resolution of 0.17nm. It’s a versatile tool in materials science and innovation, with the HT Version offering a specimen tilt of ±45°. Notable features include a microactive goniometer with motorized 5 axes, a directly coupled ion pump with a bakeout function for maintaining clean specimen environments, and computer-controlled data management and storage.
    Documents

    No documents

    JEOL

    JEM-3010

    verified-listing-icon

    Verified

    CATEGORY
    TEM

    Last Verified: Over 60 days ago

    Key Item Details
    Condition:

    Used

    Operational Status:

    Unknown

    Product ID:

    69539

    Wafer Sizes:

    Unknown

    Vintage:

    Unknown

    Have Additional Questions?
    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    Similar Listings
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    JEOL JEM-3010

    JEOL

    JEM-3010

    TEM
    Vintage: 0Condition: Used
    Last VerifiedOver 60 days ago

    JEOL

    JEM-3010

    verified-listing-icon
    Verified
    CATEGORY
    TEM
    Last Verified: Over 60 days ago
    listing-photo-3ca9b6095697432a8173a01e140cacb8-https://d2pkkbyngq3xpw.cloudfront.net/moov_media/3.0-assets/photo-coming-soon-small.png
    Key Item Details
    Condition:

    Used

    Operational Status:

    Unknown

    Product ID:

    69539

    Wafer Sizes:

    Unknown

    Vintage:

    Unknown

    Have Additional Questions?
    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    Description
    No description
    Configuration
    No Configuration
    OEM Model Description
    The JEM-3010 is an ultrahigh resolution analytical electron microscope that boasts a point resolution of 0.17nm. It’s a versatile tool in materials science and innovation, with the HT Version offering a specimen tilt of ±45°. Notable features include a microactive goniometer with motorized 5 axes, a directly coupled ion pump with a bakeout function for maintaining clean specimen environments, and computer-controlled data management and storage.
    Documents

    No documents

    Similar Listings
    View All
    JEOL JEM-3010

    JEOL

    JEM-3010

    TEMVintage: 0Condition: UsedLast Verified:Over 60 days ago