Description
No descriptionConfiguration
No ConfigurationOEM Model Description
Advanced scanning transmission electron microscope (STEM) used for high-resolution industrial metrology, semiconductor inspection, and failure analysisDocuments
No documents
HITACHI
HD2700B
CATEGORY
TEM
Last Verified: 2 days ago
Key Item Details
Condition:
Used
Operational Status:
Unknown
Product ID:
153251
Wafer Sizes:
Unknown
Vintage:
2010
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
Description
No descriptionConfiguration
No ConfigurationOEM Model Description
Advanced scanning transmission electron microscope (STEM) used for high-resolution industrial metrology, semiconductor inspection, and failure analysisDocuments
No documents