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IONTOF TOF.SIMS M6
    Description
    No description
    Configuration
    -M6 High Performance Time‑of‑Flight Secondary Ion Mass Spectrometry System – Main unit of the M6 system. -Bake‑out Loadlock – In‑chamber baking system for the loadlock. -Nanoprobe 50 – Latest‑generation high‑performance BiMn cluster ion gun for high mass resolution surface spectroscopy, high lateral spatial resolution 2D/3D imaging, and high‑performance depth profiling. -DSC O₂/CS Dual Ion Source Optical Column – Electron‑bombardment gas ion source and thermal‑ionization Cs ion source; compatible with Nanoprobe 50 for depth profiling. -Auto Gas Flood System – Pressure‑controlled leak valve and nozzle for introducing trace gases onto the sample surface during analysis; automatic gas switching via Vacuum Control Unit (VCU). -Consumables – One‑year consumables package (slightly adjustable depending on configuration).
    OEM Model Description
    None Provided
    Documents

    No documents

    IONTOF

    TOF.SIMS M6

    verified-listing-icon

    Verified

    CATEGORY
    Spectrometer / SIMS

    Last Verified: 3 days ago

    Key Item Details
    Condition:

    Used

    Operational Status:

    Unknown

    Product ID:

    149098

    Wafer Sizes:

    Unknown

    Vintage:

    Unknown

    Logistics Support
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    Similar Listings
    View All
    IONTOF TOF.SIMS M6

    IONTOF

    TOF.SIMS M6

    Spectrometer / SIMS
    Vintage: 0Condition: Used
    Last Verified3 days ago

    IONTOF

    TOF.SIMS M6

    verified-listing-icon
    Verified
    CATEGORY
    Spectrometer / SIMS
    Last Verified: 3 days ago
    listing-photo-fd3d939ac59345b895842000268c599a-https://d2pkkbyngq3xpw.cloudfront.net/moov_media/3.0-assets/photo-coming-soon-small.png
    Key Item Details
    Condition:

    Used

    Operational Status:

    Unknown

    Product ID:

    149098

    Wafer Sizes:

    Unknown

    Vintage:

    Unknown

    Logistics Support
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    Description
    No description
    Configuration
    -M6 High Performance Time‑of‑Flight Secondary Ion Mass Spectrometry System – Main unit of the M6 system. -Bake‑out Loadlock – In‑chamber baking system for the loadlock. -Nanoprobe 50 – Latest‑generation high‑performance BiMn cluster ion gun for high mass resolution surface spectroscopy, high lateral spatial resolution 2D/3D imaging, and high‑performance depth profiling. -DSC O₂/CS Dual Ion Source Optical Column – Electron‑bombardment gas ion source and thermal‑ionization Cs ion source; compatible with Nanoprobe 50 for depth profiling. -Auto Gas Flood System – Pressure‑controlled leak valve and nozzle for introducing trace gases onto the sample surface during analysis; automatic gas switching via Vacuum Control Unit (VCU). -Consumables – One‑year consumables package (slightly adjustable depending on configuration).
    OEM Model Description
    None Provided
    Documents

    No documents

    Similar Listings
    View All
    IONTOF TOF.SIMS M6

    IONTOF

    TOF.SIMS M6

    Spectrometer / SIMSVintage: 0Condition: UsedLast Verified:3 days ago