ZEISS / CARL ZEISS
NVision 40
SEM / TEM / FIB
Vintage: Unknown
Condition: As-Is
Last Verified
Over 60 days ago
The NVision 40 operates with two beams, one electron beam and one ion beam. Both beams can be used independently of each other to generate images using the secondary electrons emitted from the surface of the specimen. The ion beam can be used for imaging in addition material removal or coating purposes.
1
Inspection, Insurance, Appraisal, Logistics