Skip to main content
Moov logo

Moov Icon
Marketplace > FIB > HITACHI > MI4050

MI4050

Category
FIB
Overview

The MI4050 High-Performance Focused Ion Beam System is equipped with new optics and provides the world-leading SIM imaging resolution and high-definition TEM sample preparation with improved imaging resolution at low kV. The MI4050 accommodates a variety of applications such as cross-section observation, circuit modification, vector scan processing, nano-micro patterning, nano molding, and 3D nano fabrication using deposition function.

Active Listings

0

Services

Inspection, Insurance, Appraisal, Logistics

Top Listings

    No products found
Have one like this?
List it with Moov and find the perfect buyer in no time at all.