Description
Samples up to 9.5mm x 5mm x 2.4 mm (height)Configuration
High resolution, cold field emission SEM. 0.5 to 30 kV Magnification range of 30X to 800,000X Image resolutions of 0.6nm (at 30kV) and 3.5nm (at 1kV) are possible with secondary electron images.OEM Model Description
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HITACHI
S-5000
Verified
CATEGORY
SEM
Key Item Details
Condition:
Used
Operational Status:
Unknown
Product ID:
55337
Wafer Sizes:
Unknown
Vintage:
Unknown
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HITACHI
S-5000
Verified
CATEGORY
SEM
Last Verified: Over 60 days ago
Key Item Details
Condition:
Used
Operational Status:
Unknown
Product ID:
55337
Wafer Sizes:
Unknown
Vintage:
Unknown
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
Description
Samples up to 9.5mm x 5mm x 2.4 mm (height)Configuration
High resolution, cold field emission SEM. 0.5 to 30 kV Magnification range of 30X to 800,000X Image resolutions of 0.6nm (at 30kV) and 3.5nm (at 1kV) are possible with secondary electron images.OEM Model Description
None ProvidedDocuments
No documents