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    Key Item Details


    Operational Status:

    Product ID:68824

    Wafer Sizes:Unknown



    Windows 7


    Detectors: ESEM Secondary, Backscatter Specimen stage: X: 150mm Y: 110 mm Z: 5-65mm R: 360 degrees T: -20 -90 degrees

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    OEM Model Description

    S-3700N is designed as a new series of Tungsten-type VP-SEM to accommodate sample diameters up to 300mm using a new large specimen chamber and a large specimen stage. Moreover, simultaneous accommodations of accessory attachments for EDX, WDX and EBSP (*1) analyses are possible at optimized analytical geometry. The specimen stage has a wide traverse range for observation of sample areas up to 203mm diameter and up to 110mm height with EDX and WDX analysis.

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