Description
The lower portion of the FIB column needs to be replaced Dem column is functional but there's noise in the image Magnification range: 1000kX Detectors: SE In-Beam SE BSE Process: PCB / C4 Operating system: Windows 10 ProConfiguration
No ConfigurationOEM Model Description
None ProvidedDocuments
No documents
TESCAN
XEIA 3
CATEGORY
SEM / FIB
Last Verified: 5 days ago
Key Item Details
Condition:
Used
Operational Status:
Unknown
Product ID:
138441
Wafer Sizes:
8"/200mm
Vintage:
2016
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
Description
The lower portion of the FIB column needs to be replaced Dem column is functional but there's noise in the image Magnification range: 1000kX Detectors: SE In-Beam SE BSE Process: PCB / C4 Operating system: Windows 10 ProConfiguration
No ConfigurationOEM Model Description
None ProvidedDocuments
No documents