Description
LEO Scanning Electron Microscope (Parts only)Configuration
No ConfigurationOEM Model Description
SEM feature extra-large chambers for the non-destructive examination of large samplesDocuments
No documents
LEO
1455
Verified
CATEGORY
SEM / FIB
Last Verified: 7 days ago
Key Item Details
Condition:
Used
Operational Status:
Unknown
Product ID:
116674
Wafer Sizes:
Unknown
Vintage:
Unknown
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
LEO
1455
CATEGORY
SEM / FIB
Last Verified: 7 days ago
Key Item Details
Condition:
Used
Operational Status:
Unknown
Product ID:
116674
Wafer Sizes:
Unknown
Vintage:
Unknown
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
Description
LEO Scanning Electron Microscope (Parts only)Configuration
No ConfigurationOEM Model Description
SEM feature extra-large chambers for the non-destructive examination of large samplesDocuments
No documents