Description
Performance Resolution: 6 nm (30 kV, WD = 8 mm, secondary electron image). Magnification: 15x (WD = 48 mm) 200,000x, provided with an automatic magnification correction device. Imaging signals: Secondary electrons, backscattered electrons.Configuration
SEM system, JEOL JSM T300 electron microscope.OEM Model Description
None ProvidedDocuments
JEOL
JSM-T300
CATEGORY
SEM / FIB
Last Verified: 5 days ago
Key Item Details
Condition:
Used
Operational Status:
Installed / Idle
Product ID:
150627
Wafer Sizes:
Unknown
Vintage:
1
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available