Description
JEOL scanning electron microscope Magnification range: 5x – 600,000x Acceleration voltage: 0.5 – 30 kV Patented InLens Schottky emitter. Dual condenser system for loss-free electron extraction. Continuous beam current adjustment without aperture change. Maximum beam current up to over 300 nA. Optimized specimen chamber geometry for imaging and analytics. Fully motorized heavy-duty specimen stage with eucentric tilt and rotation for samples up to 20 cm Ø and 2 kg weight. Travel ranges: X: 125 mm, Y: 100 mm, Z: 80 mm, T: -10° ~ 90°, R: 360°. Secondary electron detector. Energy-filtered SE detection (REF mode). Fully automatic switching between high and low vacuum range via software without aperture adjustment. Image storage up to 5,120 x 3,840 pixels. Image acquisition up to over 100,000 x 100,000 pixels. Automatic pumping system with turbopump and ultra-quiet fore-vacuum pump. PC hardware-independent and fully remote-operable user software. Compact footprint: 0.78 m². Integrated compressed air damping system. Low-maintenance system without water cooling and nitrogen. Castors for mobile use. Backscattered electron detector. Workstation with Windows 10. 23" monitor. Keyboard/mouse set.Configuration
No ConfigurationOEM Model Description
None ProvidedDocuments
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Verified
CATEGORY
SEM / FIB
Last Verified: 2 days ago
Key Item Details
Condition:
Used
Operational Status:
Unknown
Product ID:
150300
Wafer Sizes:
Unknown
Vintage:
2023
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
JEOL
JSM-IT700HR
CATEGORY
SEM / FIB
Last Verified: 2 days ago
Key Item Details
Condition:
Used
Operational Status:
Unknown
Product ID:
150300
Wafer Sizes:
Unknown
Vintage:
2023
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
Description
JEOL scanning electron microscope Magnification range: 5x – 600,000x Acceleration voltage: 0.5 – 30 kV Patented InLens Schottky emitter. Dual condenser system for loss-free electron extraction. Continuous beam current adjustment without aperture change. Maximum beam current up to over 300 nA. Optimized specimen chamber geometry for imaging and analytics. Fully motorized heavy-duty specimen stage with eucentric tilt and rotation for samples up to 20 cm Ø and 2 kg weight. Travel ranges: X: 125 mm, Y: 100 mm, Z: 80 mm, T: -10° ~ 90°, R: 360°. Secondary electron detector. Energy-filtered SE detection (REF mode). Fully automatic switching between high and low vacuum range via software without aperture adjustment. Image storage up to 5,120 x 3,840 pixels. Image acquisition up to over 100,000 x 100,000 pixels. Automatic pumping system with turbopump and ultra-quiet fore-vacuum pump. PC hardware-independent and fully remote-operable user software. Compact footprint: 0.78 m². Integrated compressed air damping system. Low-maintenance system without water cooling and nitrogen. Castors for mobile use. Backscattered electron detector. Workstation with Windows 10. 23" monitor. Keyboard/mouse set.Configuration
No ConfigurationOEM Model Description
None ProvidedDocuments
No documents