Description
Scanning electron microscopeConfiguration
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JEOL
JSM-6700F
CATEGORY
SEM / FIB
Last Verified: 17 days ago
Key Item Details
Condition:
Used
Operational Status:
Unknown
Product ID:
139182
Wafer Sizes:
Unknown
Vintage:
Unknown
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
Description
Scanning electron microscopeConfiguration
No ConfigurationOEM Model Description
None ProvidedDocuments
No documents