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JEOL JSM-6490LV
    Description
    No description
    Configuration
    No Configuration
    OEM Model Description
    Presenting the JEOL 6490LV SEM featuring W-filament technology. Equipped with SE, BSE, and EDS detectors, it operates in high- or low-vacuum modes, enabling sub-micron-scale imaging and X-ray compositional data collection without sample coating. The EDS detector allows qualitative and semi-quantitative elemental analysis of sub-micron volumes, X-ray mapping over mm-scale fields of view, and X-ray line scans. Achieve comprehensive characterization effortlessly with the JEOL 6490LV SEM.
    Documents

    No documents

    JEOL

    JSM-6490LV

    verified-listing-icon

    Verified

    CATEGORY
    SEM / FIB

    Last Verified: Over 60 days ago

    Key Item Details
    Condition:

    Used

    Operational Status:

    Unknown

    Product ID:

    63964

    Wafer Sizes:

    Unknown

    Vintage:

    Unknown

    Have Additional Questions?
    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    Similar Listings
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    JEOL JSM-6490LV

    JEOL

    JSM-6490LV

    SEM / FIB
    Vintage: 0Condition: Used
    Last VerifiedOver 60 days ago
    JEOL JSM-6490LV

    JEOL

    JSM-6490LV

    SEM / FIB
    Vintage: 0Condition: Used
    Last VerifiedOver 60 days ago

    JEOL

    JSM-6490LV

    verified-listing-icon
    Verified
    CATEGORY
    SEM / FIB
    Last Verified: Over 60 days ago
    listing-photo-712dd8cfeb5a4015bacd1f6e08a51f04-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/1213/712dd8cfeb5a4015bacd1f6e08a51f04/848dd5f90dc746d497f7b65164615079_img2481_mw.jpg
    listing-photo-712dd8cfeb5a4015bacd1f6e08a51f04-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/1213/712dd8cfeb5a4015bacd1f6e08a51f04/84cd808aaf4b4f7189833c6a76a2c2f9_img2483_mw.jpg
    listing-photo-712dd8cfeb5a4015bacd1f6e08a51f04-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/1213/712dd8cfeb5a4015bacd1f6e08a51f04/304314a4dc32416eb4833ff6a308439f_img2484_mw.jpg
    listing-photo-712dd8cfeb5a4015bacd1f6e08a51f04-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/1213/712dd8cfeb5a4015bacd1f6e08a51f04/04be449eef16463fb77d90d3f91c80db_img2486_mw.jpg
    listing-photo-712dd8cfeb5a4015bacd1f6e08a51f04-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/1213/712dd8cfeb5a4015bacd1f6e08a51f04/fee8ebdec60f4f2a92f5fdcef9cc3db4_img2487_mw.jpg
    Key Item Details
    Condition:

    Used

    Operational Status:

    Unknown

    Product ID:

    63964

    Wafer Sizes:

    Unknown

    Vintage:

    Unknown

    Have Additional Questions?
    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    Description
    No description
    Configuration
    No Configuration
    OEM Model Description
    Presenting the JEOL 6490LV SEM featuring W-filament technology. Equipped with SE, BSE, and EDS detectors, it operates in high- or low-vacuum modes, enabling sub-micron-scale imaging and X-ray compositional data collection without sample coating. The EDS detector allows qualitative and semi-quantitative elemental analysis of sub-micron volumes, X-ray mapping over mm-scale fields of view, and X-ray line scans. Achieve comprehensive characterization effortlessly with the JEOL 6490LV SEM.
    Documents

    No documents

    Similar Listings
    View All
    JEOL JSM-6490LV

    JEOL

    JSM-6490LV

    SEM / FIBVintage: 0Condition: UsedLast Verified:Over 60 days ago
    JEOL JSM-6490LV

    JEOL

    JSM-6490LV

    SEM / FIBVintage: 0Condition: UsedLast Verified:Over 60 days ago