Description
No descriptionConfiguration
Resolution: 3 nm @ 30kV (SEI), 5 nm @ 30kV (BEI) Sample: 8" max., 125 mm X, 100 mm Y Options:X-SIS, EDS, IR Camera, 8" ChamberOEM Model Description
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JEOL
JSM 5900LV
Verified
CATEGORY
SEM / FIB
Last Verified: Over 60 days ago
Key Item Details
Condition:
Used
Operational Status:
Unknown
Product ID:
12079
Wafer Sizes:
8"/200mm
Vintage:
Unknown
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
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JEOL
JSM 5900LV
CATEGORY
SEM / FIB
Last Verified: Over 60 days ago
Key Item Details
Condition:
Used
Operational Status:
Unknown
Product ID:
12079
Wafer Sizes:
8"/200mm
Vintage:
Unknown
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
Description
No descriptionConfiguration
Resolution: 3 nm @ 30kV (SEI), 5 nm @ 30kV (BEI) Sample: 8" max., 125 mm X, 100 mm Y Options:X-SIS, EDS, IR Camera, 8" ChamberOEM Model Description
None ProvidedDocuments
No documents