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JEOL JEM-2010F
    Description
    No description
    Configuration
    No Configuration
    OEM Model Description
    The JEM-2010F Field Emission Electron Microscope is a versatile, high-resolution analytical tool designed for superior image quality and top-tier analytical performance. Developed for the 200kV class analytical TEM, it offers a broad range of capabilities including high-resolution image observation and microarea X-ray analysis. The JEM-2010F can be optionally equipped with energy dispersive X-ray spectrometers (EDS), a parallel detection electron energy spectrometer (PEELS), a scanning image observation device (ASID), and TV units, enhancing its functionality and adaptability to various research needs.
    Documents

    No documents

    JEOL

    JEM-2010F

    verified-listing-icon

    Verified

    CATEGORY
    SEM / FIB

    Last Verified: Over 60 days ago

    Key Item Details
    Condition:

    Used

    Operational Status:

    Unknown

    Product ID:

    70438

    Wafer Sizes:

    Unknown

    Vintage:

    Unknown

    Have Additional Questions?
    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    Similar Listings
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    JEOL JEM-2010F

    JEOL

    JEM-2010F

    SEM / FIB
    Vintage: 0Condition: Used
    Last VerifiedOver 60 days ago

    JEOL

    JEM-2010F

    verified-listing-icon
    Verified
    CATEGORY
    SEM / FIB
    Last Verified: Over 60 days ago
    listing-photo-0fc75fe78197408dac88cbbcc686cbb8-https://d2pkkbyngq3xpw.cloudfront.net/moov_media/3.0-assets/photo-coming-soon-small.png
    Key Item Details
    Condition:

    Used

    Operational Status:

    Unknown

    Product ID:

    70438

    Wafer Sizes:

    Unknown

    Vintage:

    Unknown

    Have Additional Questions?
    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    Description
    No description
    Configuration
    No Configuration
    OEM Model Description
    The JEM-2010F Field Emission Electron Microscope is a versatile, high-resolution analytical tool designed for superior image quality and top-tier analytical performance. Developed for the 200kV class analytical TEM, it offers a broad range of capabilities including high-resolution image observation and microarea X-ray analysis. The JEM-2010F can be optionally equipped with energy dispersive X-ray spectrometers (EDS), a parallel detection electron energy spectrometer (PEELS), a scanning image observation device (ASID), and TV units, enhancing its functionality and adaptability to various research needs.
    Documents

    No documents

    Similar Listings
    View All
    JEOL JEM-2010F

    JEOL

    JEM-2010F

    SEM / FIBVintage: 0Condition: UsedLast Verified:Over 60 days ago