Skip to main content
6" Fab For Sale from Moov - Click Here to Learn More
6" Fab For Sale from Moov - Click Here to Learn More
Moov logo

6" Fab For Sale from Moov - Click Here to Learn More
Moov Icon
THERMOFISHER SCIENTIFIC / FEI / PHILLIPS XL50
    Description
    No description
    Configuration
    Scanning Electron Microscope (SEM FEI XL50 Large sample chamber w/ load lock Capable to navigate full 8” wafer. Stage platen to hold full wafer Stage platen for multi stub analysis System is installed and operational Noran EDS detector
    OEM Model Description
    Scanning Electron Microscope
    Documents

    No documents

    THERMOFISHER SCIENTIFIC / FEI / PHILLIPS

    XL50

    verified-listing-icon

    Verified

    CATEGORY
    SEM / FIB

    Last Verified: Over 60 days ago

    Key Item Details

    Condition:

    Used


    Operational Status:

    Installed / Running


    Product ID:

    106592


    Wafer Sizes:

    8"/200mm


    Vintage:

    Unknown


    Have Additional Questions?
    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    Similar Listings
    View All
    THERMOFISHER SCIENTIFIC / FEI / PHILLIPS XL50

    THERMOFISHER SCIENTIFIC / FEI / PHILLIPS

    XL50

    SEM / FIB
    Vintage: 0Condition: Used
    Last VerifiedOver 60 days ago

    THERMOFISHER SCIENTIFIC / FEI / PHILLIPS

    XL50

    verified-listing-icon
    Verified
    CATEGORY
    SEM / FIB
    Last Verified: Over 60 days ago
    listing-photo-59b41486c9eb41aabe13c232cdf27b8b-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/43608/59b41486c9eb41aabe13c232cdf27b8b/38dae80b71814bf38a53fc90587c4001_236677b67b9a49f496b86efa74f8c8a61201a_mw.jpeg
    listing-photo-59b41486c9eb41aabe13c232cdf27b8b-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/43608/59b41486c9eb41aabe13c232cdf27b8b/182dd0818a3c4f1ebcd2984df58fadad_4039d73b2f624fc38421d284403382061201a_mw.jpeg
    listing-photo-59b41486c9eb41aabe13c232cdf27b8b-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/43608/59b41486c9eb41aabe13c232cdf27b8b/f19cd4d7032b42afa4f4ca49ca31ac5e_e6751da9a7a440adba2a12ad59206d69_mw.jpeg
    listing-photo-59b41486c9eb41aabe13c232cdf27b8b-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/43608/59b41486c9eb41aabe13c232cdf27b8b/50d72f683ea34c459c3d7ca97e79b32b_984fc513ced24c68b8b4b97e2c0ca1dc_mw.jpeg
    listing-photo-59b41486c9eb41aabe13c232cdf27b8b-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/43608/59b41486c9eb41aabe13c232cdf27b8b/ff5806e127714b8a96b87b5df596e3b1_59947b8bf1cf4383a1e7bb42846a4d65_mw.jpeg
    listing-photo-59b41486c9eb41aabe13c232cdf27b8b-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/43608/59b41486c9eb41aabe13c232cdf27b8b/7a4ea99a073e479fa132a4e522459d03_c8c06cebf72d4a519cb388abe2986a9b_mw.jpeg
    listing-photo-59b41486c9eb41aabe13c232cdf27b8b-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/43608/59b41486c9eb41aabe13c232cdf27b8b/e0b80c59da634d99822f2da87afdcc1f_457737e8432b4a829c675216985da2c4_mw.jpeg
    listing-photo-59b41486c9eb41aabe13c232cdf27b8b-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/43608/59b41486c9eb41aabe13c232cdf27b8b/8b82e9f60e984966b66013297f2ea9b2_c32f68d622e34971aa078c1f85f9f2521201a_mw.jpeg
    Key Item Details

    Condition:

    Used


    Operational Status:

    Installed / Running


    Product ID:

    106592


    Wafer Sizes:

    8"/200mm


    Vintage:

    Unknown


    Have Additional Questions?
    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    Description
    No description
    Configuration
    Scanning Electron Microscope (SEM FEI XL50 Large sample chamber w/ load lock Capable to navigate full 8” wafer. Stage platen to hold full wafer Stage platen for multi stub analysis System is installed and operational Noran EDS detector
    OEM Model Description
    Scanning Electron Microscope
    Documents

    No documents

    Similar Listings
    View All
    THERMOFISHER SCIENTIFIC / FEI / PHILLIPS XL50

    THERMOFISHER SCIENTIFIC / FEI / PHILLIPS

    XL50

    SEM / FIBVintage: 0Condition: UsedLast Verified:Over 60 days ago