
Description
Wafer SEMConfiguration
No ConfigurationOEM Model Description
High-precision 300 mm full-wafer focused ion beam scanning electron microscopeDocuments
No documents
CATEGORY
SEM / FIB
Last Verified: 14 days ago
Key Item Details
Condition:
Used
Operational Status:
Unknown
Product ID:
152412
Wafer Sizes:
Unknown
Vintage:
Unknown
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
THERMOFISHER SCIENTIFIC / FEI / PHILIPS
Helios 5 EXL
CATEGORY
SEM / FIB
Last Verified: 14 days ago
Key Item Details
Condition:
Used
Operational Status:
Unknown
Product ID:
152412
Wafer Sizes:
Unknown
Vintage:
Unknown
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
Description
Wafer SEMConfiguration
No ConfigurationOEM Model Description
High-precision 300 mm full-wafer focused ion beam scanning electron microscopeDocuments
No documents