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THERMOFISHER SCIENTIFIC / FEI / PHILLIPS XL830
    Description
    No description
    Configuration
    No Configuration
    OEM Model Description
    The FEI XL830 is a DualBeam FIB/SEM system that offers high-resolution SEM imaging and quick, accurate ion milling. The SEM column of the DualBeam XL830 workstation delivers 3-nm resolution within the range of 1-30 kV, while the electron column features balanced-field, in-lens detection that provides detailed topographical information, improved visibility down holes, and enhanced imaging of grain boundaries.
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    THERMOFISHER SCIENTIFIC / FEI / PHILLIPS

    XL830

    verified-listing-icon

    Verified

    CATEGORY
    SEM / FIB

    Last Verified: Over 60 days ago

    Key Item Details
    Condition:

    Used

    Operational Status:

    Unknown

    Product ID:

    30669

    Wafer Sizes:

    Unknown

    Vintage:

    Unknown

    Have Additional Questions?
    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
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    Available
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    THERMOFISHER SCIENTIFIC / FEI / PHILLIPS XL830

    THERMOFISHER SCIENTIFIC / FEI / PHILLIPS

    XL830

    SEM / FIB
    Vintage: 0Condition: Used
    Last VerifiedOver 60 days ago

    THERMOFISHER SCIENTIFIC / FEI / PHILLIPS

    XL830

    verified-listing-icon
    Verified
    CATEGORY
    SEM / FIB
    Last Verified: Over 60 days ago
    listing-photo-21b0404c395e4c6cb340891ae3cd0920-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/44191/21b0404c395e4c6cb340891ae3cd0920/a9ece459302f4f4a9d9fe49bb739dfc2_3c6c4219291b4a85b2e3ec40a2d99e771201a_mw.jpeg
    listing-photo-21b0404c395e4c6cb340891ae3cd0920-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/44191/21b0404c395e4c6cb340891ae3cd0920/f5cc3f6d64e848ebbac6e9b6156d8011_3c168eac3d7345e2b2f2bd7378b4785b1201a_mw.jpeg
    listing-photo-21b0404c395e4c6cb340891ae3cd0920-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/44191/21b0404c395e4c6cb340891ae3cd0920/0a761968da0347c19ed6dbdb29e2c382_73add5f7d18a49ae9777763c585d81111201a_mw.jpeg
    Key Item Details
    Condition:

    Used

    Operational Status:

    Unknown

    Product ID:

    30669

    Wafer Sizes:

    Unknown

    Vintage:

    Unknown

    Have Additional Questions?
    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    Description
    No description
    Configuration
    No Configuration
    OEM Model Description
    The FEI XL830 is a DualBeam FIB/SEM system that offers high-resolution SEM imaging and quick, accurate ion milling. The SEM column of the DualBeam XL830 workstation delivers 3-nm resolution within the range of 1-30 kV, while the electron column features balanced-field, in-lens detection that provides detailed topographical information, improved visibility down holes, and enhanced imaging of grain boundaries.
    Documents

    No documents

    Similar Listings
    View All
    THERMOFISHER SCIENTIFIC / FEI / PHILLIPS XL830

    THERMOFISHER SCIENTIFIC / FEI / PHILLIPS

    XL830

    SEM / FIBVintage: 0Condition: UsedLast Verified:Over 60 days ago