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THERMOFISHER SCIENTIFIC / FEI / PHILLIPS XL830
  • THERMOFISHER SCIENTIFIC / FEI / PHILLIPS XL830
  • THERMOFISHER SCIENTIFIC / FEI / PHILLIPS XL830
  • THERMOFISHER SCIENTIFIC / FEI / PHILLIPS XL830
Description
No description
Configuration
No Configuration
OEM Model Description
The FEI XL830 is a DualBeam FIB/SEM system that offers high-resolution SEM imaging and quick, accurate ion milling. The SEM column of the DualBeam XL830 workstation delivers 3-nm resolution within the range of 1-30 kV, while the electron column features balanced-field, in-lens detection that provides detailed topographical information, improved visibility down holes, and enhanced imaging of grain boundaries.
Documents

No documents

THERMOFISHER SCIENTIFIC / FEI / PHILLIPS

XL830

verified-listing-icon

Verified

CATEGORY
SEM / FIB

Last Verified: Over 60 days ago

Key Item Details
Condition:

Used

Operational Status:

Unknown

Product ID:

30669

Wafer Sizes:

Unknown

Vintage:

Unknown

Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
Similar Listings
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THERMOFISHER SCIENTIFIC / FEI / PHILLIPS XL830

THERMOFISHER SCIENTIFIC / FEI / PHILLIPS

XL830

SEM / FIB
Vintage: 0Condition: Used
Last VerifiedOver 60 days ago

THERMOFISHER SCIENTIFIC / FEI / PHILLIPS

XL830

verified-listing-icon
Verified
CATEGORY
SEM / FIB
Last Verified: Over 60 days ago
listing-photo-21b0404c395e4c6cb340891ae3cd0920-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/44191/21b0404c395e4c6cb340891ae3cd0920/a9ece459302f4f4a9d9fe49bb739dfc2_3c6c4219291b4a85b2e3ec40a2d99e771201a_mw.jpeg
listing-photo-21b0404c395e4c6cb340891ae3cd0920-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/44191/21b0404c395e4c6cb340891ae3cd0920/f5cc3f6d64e848ebbac6e9b6156d8011_3c168eac3d7345e2b2f2bd7378b4785b1201a_mw.jpeg
listing-photo-21b0404c395e4c6cb340891ae3cd0920-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/44191/21b0404c395e4c6cb340891ae3cd0920/0a761968da0347c19ed6dbdb29e2c382_73add5f7d18a49ae9777763c585d81111201a_mw.jpeg
Key Item Details
Condition:

Used

Operational Status:

Unknown

Product ID:

30669

Wafer Sizes:

Unknown

Vintage:

Unknown

Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
Description
No description
Configuration
No Configuration
OEM Model Description
The FEI XL830 is a DualBeam FIB/SEM system that offers high-resolution SEM imaging and quick, accurate ion milling. The SEM column of the DualBeam XL830 workstation delivers 3-nm resolution within the range of 1-30 kV, while the electron column features balanced-field, in-lens detection that provides detailed topographical information, improved visibility down holes, and enhanced imaging of grain boundaries.
Documents

No documents

Similar Listings
View All
THERMOFISHER SCIENTIFIC / FEI / PHILLIPS XL830

THERMOFISHER SCIENTIFIC / FEI / PHILLIPS

XL830

SEM / FIBVintage: 0Condition: UsedLast Verified:Over 60 days ago