Description
FEI FIB 800 Focused Ion BeamConfiguration
System Joystick Oil pump Hard Disk Drive Prelens column Beam current: 1 pA - 11 nA Deposition system: EE Vacuum types: Turbo molecular pump Mechanical pump Ion getter pump Stage type: Motor stage for XL50, 8" Type: Load lock Detector: CDEM Operating system: Windows NT 4.0OEM Model Description
The FEI FIB 800 is a state-of-the-art Focused Ion Beam (FIB) system that is utilized for a variety of applications, including circuit editing, defect and failure analysis, TEM lamella preparation, nanofabrication, nanoprototyping, and MEMS. It employs a Magnum ion column and boasts a milling power of 21nA beam current. The system can accommodate samples with diameters up to 200mm and features a 5-axis motorized eucentric tilt stage. Additionally, it includes a gas injection system with up to four injectors and a vacuum system with column IGP, air-cooled Turbo, and mechanical PVP.Documents
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THERMOFISHER SCIENTIFIC / FEI / PHILLIPS
FIB 800
Verified
CATEGORY
SEM / FIB
Last Verified: Over 60 days ago
Key Item Details
Condition:
Used
Operational Status:
Unknown
Product ID:
68765
Wafer Sizes:
Unknown
Vintage:
1998
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
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THERMOFISHER SCIENTIFIC / FEI / PHILLIPS
FIB 800
CATEGORY
SEM / FIB
Last Verified: Over 60 days ago
Key Item Details
Condition:
Used
Operational Status:
Unknown
Product ID:
68765
Wafer Sizes:
Unknown
Vintage:
1998
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
Description
FEI FIB 800 Focused Ion BeamConfiguration
System Joystick Oil pump Hard Disk Drive Prelens column Beam current: 1 pA - 11 nA Deposition system: EE Vacuum types: Turbo molecular pump Mechanical pump Ion getter pump Stage type: Motor stage for XL50, 8" Type: Load lock Detector: CDEM Operating system: Windows NT 4.0OEM Model Description
The FEI FIB 800 is a state-of-the-art Focused Ion Beam (FIB) system that is utilized for a variety of applications, including circuit editing, defect and failure analysis, TEM lamella preparation, nanofabrication, nanoprototyping, and MEMS. It employs a Magnum ion column and boasts a milling power of 21nA beam current. The system can accommodate samples with diameters up to 200mm and features a 5-axis motorized eucentric tilt stage. Additionally, it includes a gas injection system with up to four injectors and a vacuum system with column IGP, air-cooled Turbo, and mechanical PVP.Documents
No documents