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6" Fab For Sale from Moov - Click Here to Learn More
6" Fab For Sale from Moov - Click Here to Learn More
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6" Fab For Sale from Moov - Click Here to Learn More
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TAKANO / TOPCON WM-2500
    Description
    No description
    Configuration
    No Configuration
    OEM Model Description
    Light source: Argon ion laser Detecting/scanning method: Scattered light detecting / helical scanning method Detectivity: Bare 0.055 microns / film 0.07 microns Dynamic range: 0.055 microns to 5 microns Reproducibility: σn /≦1% Wafer Size 200/150mm
    Documents

    No documents

    TAKANO / TOPCON

    WM-2500

    verified-listing-icon

    Verified

    CATEGORY
    Reticle / Mask Inspection

    Last Verified: Over 60 days ago

    Key Item Details
    Condition:

    Used

    Operational Status:

    Unknown

    Product ID:

    65917

    Wafer Sizes:

    8"/200mm

    Vintage:

    Unknown

    Have Additional Questions?
    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    Similar Listings
    View All
    TAKANO / TOPCON WM-2500

    TAKANO / TOPCON

    WM-2500

    Reticle / Mask Inspection
    Vintage: 0Condition: Used
    Last VerifiedOver 60 days ago
    TAKANO / TOPCON WM-2500

    TAKANO / TOPCON

    WM-2500

    Reticle / Mask Inspection
    Vintage: 0Condition: Used
    Last VerifiedOver 60 days ago

    TAKANO / TOPCON

    WM-2500

    verified-listing-icon
    Verified
    CATEGORY
    Reticle / Mask Inspection
    Last Verified: Over 60 days ago
    listing-photo-3480aa248dfd465790f01b72ee1b72a8-https://d2pkkbyngq3xpw.cloudfront.net/moov_media/3.0-assets/photo-coming-soon-small.png
    Key Item Details
    Condition:

    Used

    Operational Status:

    Unknown

    Product ID:

    65917

    Wafer Sizes:

    8"/200mm

    Vintage:

    Unknown

    Have Additional Questions?
    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    Description
    No description
    Configuration
    No Configuration
    OEM Model Description
    Light source: Argon ion laser Detecting/scanning method: Scattered light detecting / helical scanning method Detectivity: Bare 0.055 microns / film 0.07 microns Dynamic range: 0.055 microns to 5 microns Reproducibility: σn /≦1% Wafer Size 200/150mm
    Documents

    No documents

    Similar Listings
    View All
    TAKANO / TOPCON WM-2500

    TAKANO / TOPCON

    WM-2500

    Reticle / Mask InspectionVintage: 0Condition: UsedLast Verified:Over 60 days ago
    TAKANO / TOPCON WM-2500

    TAKANO / TOPCON

    WM-2500

    Reticle / Mask InspectionVintage: 0Condition: UsedLast Verified:Over 60 days ago