Description
- Dual hi/lo res gauges - ASC2000 Controller - 5 Cassettes - E Station - Prealign Station - Optional High / Low Resistivity Stations - Optional Dual End Effector Robot - 2 send / 3 Receive Note: Frame is suitable for upgrade to ADE 9600 WaferscanConfiguration
No ConfigurationOEM Model Description
The UltraScan 9000 series of products are high throughput, in-line production systems that perform metrology and sorting at various stages of the wafer manufacturing and device fabrication processes. The 9300 and 9350 systems, introduced in 1990, employ the Company's E station measurement module to measure thickness down to an accuracy of 0.5 microns.Documents
No documents
KLA / ADE
ULTRASCAN 9300
Verified
CATEGORY
Reticle / Mask Inspection
Last Verified: Over 60 days ago
Key Item Details
Condition:
Refurbished
Operational Status:
Unknown
Product ID:
105051
Wafer Sizes:
Unknown
Vintage:
Unknown
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
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KLA / ADE
ULTRASCAN 9300
CATEGORY
Reticle / Mask Inspection
Last Verified: Over 60 days ago
Key Item Details
Condition:
Refurbished
Operational Status:
Unknown
Product ID:
105051
Wafer Sizes:
Unknown
Vintage:
Unknown
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
Description
- Dual hi/lo res gauges - ASC2000 Controller - 5 Cassettes - E Station - Prealign Station - Optional High / Low Resistivity Stations - Optional Dual End Effector Robot - 2 send / 3 Receive Note: Frame is suitable for upgrade to ADE 9600 WaferscanConfiguration
No ConfigurationOEM Model Description
The UltraScan 9000 series of products are high throughput, in-line production systems that perform metrology and sorting at various stages of the wafer manufacturing and device fabrication processes. The 9300 and 9350 systems, introduced in 1990, employ the Company's E station measurement module to measure thickness down to an accuracy of 0.5 microns.Documents
No documents