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KLA RS75
    Description
    RS measuring machine
    Configuration
    No Configuration
    OEM Model Description
    The OmniMap RS75 is a four-point probe series that offers precise sheet resistance measurements for monitor wafers. It is faster than existing systems and is suitable for a variety of semiconductor process monitoring applications, including ion implantation, metal deposition, CMP, diffusion, polysilicon, epi, RTP, and bulk silicon. The system can process over 100 wafers per hour when conducting a five-site test on 200 mm wafers, with temperature compensation and flat alignment. A 49-site contour map with temperature compensation can be completed on a manually loaded test wafer in less than sixty seconds. This makes the OmniMap RS75 a production-worthy tool for sheet resistance mapping.
    Documents

    No documents

    KLA

    RS75

    verified-listing-icon

    Verified

    CATEGORY
    Resistivity / Four Point Probe

    Last Verified: Over 30 days ago

    Key Item Details
    Condition:

    Used

    Operational Status:

    Unknown

    Product ID:

    112618

    Wafer Sizes:

    8"/200mm

    Vintage:

    Unknown

    Have Additional Questions?
    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    Similar Listings
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    KLA RS75

    KLA

    RS75

    Resistivity / Four Point Probe
    Vintage: 0Condition: Used
    Last VerifiedOver 30 days ago

    KLA

    RS75

    verified-listing-icon
    Verified
    CATEGORY
    Resistivity / Four Point Probe
    Last Verified: Over 30 days ago
    listing-photo-ce0eb3692ff04466b57262a060644549-https://d2pkkbyngq3xpw.cloudfront.net/moov_media/3.0-assets/photo-coming-soon-small.png
    Key Item Details
    Condition:

    Used

    Operational Status:

    Unknown

    Product ID:

    112618

    Wafer Sizes:

    8"/200mm

    Vintage:

    Unknown

    Have Additional Questions?
    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    Description
    RS measuring machine
    Configuration
    No Configuration
    OEM Model Description
    The OmniMap RS75 is a four-point probe series that offers precise sheet resistance measurements for monitor wafers. It is faster than existing systems and is suitable for a variety of semiconductor process monitoring applications, including ion implantation, metal deposition, CMP, diffusion, polysilicon, epi, RTP, and bulk silicon. The system can process over 100 wafers per hour when conducting a five-site test on 200 mm wafers, with temperature compensation and flat alignment. A 49-site contour map with temperature compensation can be completed on a manually loaded test wafer in less than sixty seconds. This makes the OmniMap RS75 a production-worthy tool for sheet resistance mapping.
    Documents

    No documents

    Similar Listings
    View All
    KLA RS75

    KLA

    RS75

    Resistivity / Four Point ProbeVintage: 0Condition: UsedLast Verified:Over 30 days ago