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6" Fab For Sale from Moov - Click Here to Learn More
6" Fab For Sale from Moov - Click Here to Learn More
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6" Fab For Sale from Moov - Click Here to Learn More
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KLA RS75
  • KLA RS75
  • KLA RS75
  • KLA RS75
  • KLA RS75
  • KLA RS75
  • KLA RS75
  • KLA RS75
  • KLA RS75
Description
No description
Configuration
No Configuration
OEM Model Description
The OmniMap RS75 is a four-point probe series that offers precise sheet resistance measurements for monitor wafers. It is faster than existing systems and is suitable for a variety of semiconductor process monitoring applications, including ion implantation, metal deposition, CMP, diffusion, polysilicon, epi, RTP, and bulk silicon. The system can process over 100 wafers per hour when conducting a five-site test on 200 mm wafers, with temperature compensation and flat alignment. A 49-site contour map with temperature compensation can be completed on a manually loaded test wafer in less than sixty seconds. This makes the OmniMap RS75 a production-worthy tool for sheet resistance mapping.
Documents

No documents

KLA

RS75

verified-listing-icon

Verified

CATEGORY
Resistivity / Four Point Probe

Last Verified: Over 60 days ago

Key Item Details

Condition:

Refurbished


Operational Status:

Unknown


Product ID:

115314


Wafer Sizes:

Unknown


Vintage:

Unknown


Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available

KLA

RS75

verified-listing-icon
Verified
CATEGORY
Resistivity / Four Point Probe
Last Verified: Over 60 days ago
listing-photo-0e7c0a109d9048fc95d82061518a74ac-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/46062/0e7c0a109d9048fc95d82061518a74ac/f2a983940adf42f2909b2930886a74b3_img0602_mw.jpg
listing-photo-0e7c0a109d9048fc95d82061518a74ac-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/46062/0e7c0a109d9048fc95d82061518a74ac/29dcd5a533d44c76aab7179f4d103ef8_img0596_mw.jpg
listing-photo-0e7c0a109d9048fc95d82061518a74ac-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/46062/0e7c0a109d9048fc95d82061518a74ac/a61971bd640a4f0b80b757e47ad63db6_img0601_mw.jpg
listing-photo-0e7c0a109d9048fc95d82061518a74ac-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/46062/0e7c0a109d9048fc95d82061518a74ac/d5159b4be0ac4c2da53b8be779608fdc_img0594_mw.jpg
listing-photo-0e7c0a109d9048fc95d82061518a74ac-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/46062/0e7c0a109d9048fc95d82061518a74ac/e7af9df8a3574f869d6e7e3f1fa397ed_img0597_mw.jpg
listing-photo-0e7c0a109d9048fc95d82061518a74ac-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/46062/0e7c0a109d9048fc95d82061518a74ac/35547753a39041a38ed50afa348a0970_img0598_mw.jpg
listing-photo-0e7c0a109d9048fc95d82061518a74ac-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/46062/0e7c0a109d9048fc95d82061518a74ac/2000781c16e64bf8a7541e7b684cc2da_img0599_mw.jpg
listing-photo-0e7c0a109d9048fc95d82061518a74ac-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/46062/0e7c0a109d9048fc95d82061518a74ac/ecbbdbdcf4e0406b88ce18bf49682edc_img0595_mw.jpg
Key Item Details

Condition:

Refurbished


Operational Status:

Unknown


Product ID:

115314


Wafer Sizes:

Unknown


Vintage:

Unknown


Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
Description
No description
Configuration
No Configuration
OEM Model Description
The OmniMap RS75 is a four-point probe series that offers precise sheet resistance measurements for monitor wafers. It is faster than existing systems and is suitable for a variety of semiconductor process monitoring applications, including ion implantation, metal deposition, CMP, diffusion, polysilicon, epi, RTP, and bulk silicon. The system can process over 100 wafers per hour when conducting a five-site test on 200 mm wafers, with temperature compensation and flat alignment. A 49-site contour map with temperature compensation can be completed on a manually loaded test wafer in less than sixty seconds. This makes the OmniMap RS75 a production-worthy tool for sheet resistance mapping.
Documents

No documents