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KLA HRP-240
    Description
    KLA-Tencor HRP-240 ETCH In-Line Profiler
    Configuration
    Profilometer
    OEM Model Description
    The HRP-240 is an automated high-resolution surface metrology tool that provides long scan profilometry and high-resolution imaging for CMP and Etch applications. It has a new Dipping Mode™ capability for high aspect ratio depth monitoring and is reliable and easy to use for high-speed step height monitoring. It is the best solution for topographic metrology for wafer sizes up to 200 mm and can be configured as a basic profiler or a high-resolution, high aspect ratio instrument.
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    KLA

    HRP-240

    verified-listing-icon

    Verified

    CATEGORY
    Profiler

    Last Verified: Over 30 days ago

    Key Item Details

    Condition:

    Used


    Operational Status:

    Unknown


    Product ID:

    93195


    Wafer Sizes:

    Unknown


    Vintage:

    Unknown

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    KLA

    HRP-240

    verified-listing-icon
    Verified
    CATEGORY
    Profiler
    Last Verified: Over 30 days ago
    listing-photo-7474382636c54272af3ddf99c7b9f6ea-https://d2pkkbyngq3xpw.cloudfront.net/moov_media/3.0-assets/photo-coming-soon-small.png
    Key Item Details

    Condition:

    Used


    Operational Status:

    Unknown


    Product ID:

    93195


    Wafer Sizes:

    Unknown


    Vintage:

    Unknown


    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    Description
    KLA-Tencor HRP-240 ETCH In-Line Profiler
    Configuration
    Profilometer
    OEM Model Description
    The HRP-240 is an automated high-resolution surface metrology tool that provides long scan profilometry and high-resolution imaging for CMP and Etch applications. It has a new Dipping Mode™ capability for high aspect ratio depth monitoring and is reliable and easy to use for high-speed step height monitoring. It is the best solution for topographic metrology for wafer sizes up to 200 mm and can be configured as a basic profiler or a high-resolution, high aspect ratio instrument.
    Documents

    No documents

    Similar Listings
    View All

    No Similar Listings