Description
- Measurement Type: Stylus surface profiling (2D scan) - XY Stage: Manual stage, supports up to 150 mm wafers - OS: Windows XP - KLA OS: Profiler V7.35 - Microhead SR - Software: Profiler Application pre-installed on PC - Optics: Video camera with zoom/focus - Monitor, Windows PC, Keyboard & Mouse: IncludedConfiguration
No ConfigurationOEM Model Description
In July 2008, KLA launched the P-6 system which provides stylus profiling and analysis of surface topography, for issues such as roughness, film stress and curvature, in an economical benchtop design for samples up to 150mm.Documents
No documents
KLA
P-6
CATEGORY
Profiler
Last Verified: 2 days ago
Key Item Details
Condition:
Refurbished
Operational Status:
Unknown
Product ID:
140006
Wafer Sizes:
Unknown
Vintage:
Unknown
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
Description
- Measurement Type: Stylus surface profiling (2D scan) - XY Stage: Manual stage, supports up to 150 mm wafers - OS: Windows XP - KLA OS: Profiler V7.35 - Microhead SR - Software: Profiler Application pre-installed on PC - Optics: Video camera with zoom/focus - Monitor, Windows PC, Keyboard & Mouse: IncludedConfiguration
No ConfigurationOEM Model Description
In July 2008, KLA launched the P-6 system which provides stylus profiling and analysis of surface topography, for issues such as roughness, film stress and curvature, in an economical benchtop design for samples up to 150mm.Documents
No documents