Description
Profiling systemConfiguration
No ConfigurationOEM Model Description
The cyberSCAN VANTAGE is a laser based non-contact inspection system. It combines high resolution sensor technology with x- and y-translation stages for surface scanning. The system can measure large areas up to 200mm with maximum x-, y-, z-resolution. All electronic components are integrated into a robust cast metal housing, no cables or external controllers are required. The proprietary and user friendly cyberTECHNOLOGIES Software offers sophisticated surface metrology analyses and automated measurement routines.Documents
No documents
CATEGORY
Profiler
Last Verified: 11 days ago
Key Item Details
Condition:
Used
Operational Status:
Unknown
Product ID:
153374
Wafer Sizes:
Unknown
Vintage:
2008
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
CYBER TECHNOLOGIES
cyberSCAN VANTAGE
CATEGORY
Profiler
Last Verified: 11 days ago
Key Item Details
Condition:
Used
Operational Status:
Unknown
Product ID:
153374
Wafer Sizes:
Unknown
Vintage:
2008
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
Description
Profiling systemConfiguration
No ConfigurationOEM Model Description
The cyberSCAN VANTAGE is a laser based non-contact inspection system. It combines high resolution sensor technology with x- and y-translation stages for surface scanning. The system can measure large areas up to 200mm with maximum x-, y-, z-resolution. All electronic components are integrated into a robust cast metal housing, no cables or external controllers are required. The proprietary and user friendly cyberTECHNOLOGIES Software offers sophisticated surface metrology analyses and automated measurement routines.Documents
No documents