Description
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CYBERSCAN VANTAGE 50DOEM Model Description
The cyberSCAN VANTAGE 50 is a compact, non-contact profiling system for fast scanning of any part or surface. The system combines a laser sensor, a base unit with an integrated translation stage and a PC or a laptop for data analysis. The sensor scans over the sample and produces a high-resolution height profile. The confocal laser sensor can also produce a scan line with the width of 1.1 mm and a lateral resolution of 2 μm. In combination with the translation stage a highly accurate 3D raster can be recorded. The software offers sophisticated surface metrology analyses and automated measurement routines.Documents
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CYBER TECHNOLOGIES
cyberSCAN VANTAGE 50
Verified
CATEGORY
Profiler
Last Verified: Over 60 days ago
Key Item Details
Condition:
Used
Operational Status:
Unknown
Product ID:
54169
Wafer Sizes:
Unknown
Vintage:
Unknown
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
CYBER TECHNOLOGIES
cyberSCAN VANTAGE 50
CATEGORY
Profiler
Last Verified: Over 60 days ago
Key Item Details
Condition:
Used
Operational Status:
Unknown
Product ID:
54169
Wafer Sizes:
Unknown
Vintage:
Unknown
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
Description
No descriptionConfiguration
CYBERSCAN VANTAGE 50DOEM Model Description
The cyberSCAN VANTAGE 50 is a compact, non-contact profiling system for fast scanning of any part or surface. The system combines a laser sensor, a base unit with an integrated translation stage and a PC or a laptop for data analysis. The sensor scans over the sample and produces a high-resolution height profile. The confocal laser sensor can also produce a scan line with the width of 1.1 mm and a lateral resolution of 2 μm. In combination with the translation stage a highly accurate 3D raster can be recorded. The software offers sophisticated surface metrology analyses and automated measurement routines.Documents
No documents