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AMBIOS TECHNOLOGY, INC XP-1
    Description
    No description
    Configuration
    - Max. Scan Length : 30 mm - Max. Data Points : 120,000 - Stylus Force : 0.03~10mg (programmable) - 2.5 um Stylus Tip Radius Standard - Color Camera with fixed zoom 100X - Sample Thickness : 20 mm max. - Sample Size : 140mm diameter max. - Sample Translation : Manual Stage, X,Y Stage - 360 degree Rotation Stage(Manual) - Vertical Range : 400um - Vertical Resolution : 1 Å - 5Å Repeatability
    OEM Model Description
    The AMBIOS XP-I profilometer allows the analysis of surface roughness with nanometer depth resolution using an adjustable needle pressure force in the range of 0.05 to 10 mg.
    Documents

    No documents

    AMBIOS TECHNOLOGY, INC

    XP-1

    verified-listing-icon

    Verified

    CATEGORY
    Profiler

    Last Verified: 2 days ago

    Key Item Details
    Condition:

    Used

    Operational Status:

    Unknown

    Product ID:

    155034

    Wafer Sizes:

    Unknown

    Vintage:

    Unknown

    Logistics Support
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    Similar Listings
    View All
    AMBIOS TECHNOLOGY, INC XP-1

    AMBIOS TECHNOLOGY, INC

    XP-1

    Profiler
    Vintage: 0Condition: Used
    Last Verified2 days ago

    AMBIOS TECHNOLOGY, INC

    XP-1

    verified-listing-icon
    Verified
    CATEGORY
    Profiler
    Last Verified: 2 days ago
    listing-photo-8fd22e7c38514652ae419bee591ab414-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/55302/8fd22e7c38514652ae419bee591ab414/11c38b000a5746088fa3d2014906163a_xp11_mw.jpg
    listing-photo-8fd22e7c38514652ae419bee591ab414-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/55302/8fd22e7c38514652ae419bee591ab414/e1c060833aec404c85100c01b8946da6_xp12_mw.jpg
    listing-photo-8fd22e7c38514652ae419bee591ab414-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/55302/8fd22e7c38514652ae419bee591ab414/a2925161713540cb92246a2e19d62e11_xp13_mw.jpg
    Key Item Details
    Condition:

    Used

    Operational Status:

    Unknown

    Product ID:

    155034

    Wafer Sizes:

    Unknown

    Vintage:

    Unknown

    Logistics Support
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    Description
    No description
    Configuration
    - Max. Scan Length : 30 mm - Max. Data Points : 120,000 - Stylus Force : 0.03~10mg (programmable) - 2.5 um Stylus Tip Radius Standard - Color Camera with fixed zoom 100X - Sample Thickness : 20 mm max. - Sample Size : 140mm diameter max. - Sample Translation : Manual Stage, X,Y Stage - 360 degree Rotation Stage(Manual) - Vertical Range : 400um - Vertical Resolution : 1 Å - 5Å Repeatability
    OEM Model Description
    The AMBIOS XP-I profilometer allows the analysis of surface roughness with nanometer depth resolution using an adjustable needle pressure force in the range of 0.05 to 10 mg.
    Documents

    No documents

    Similar Listings
    View All
    AMBIOS TECHNOLOGY, INC XP-1

    AMBIOS TECHNOLOGY, INC

    XP-1

    ProfilerVintage: 0Condition: UsedLast Verified:2 days ago