Description
No descriptionConfiguration
Automatic frame prober Specification of wafer, 6-8" Thickness: 350-1000 um Die size: 350-75000 umOEM Model Description
Precio octo™ is an 8-inch wafer prober that dramatically increases productivity by using ultra-high-speed indexing and high-speed wafer exchange functions to reduce test costs and improve Cost of Ownership. The structure has been strengthened and major components and optics have been improved to reduce vibration, resulting in superior operation. Additionally, the installation of TELPADS™-I automatic probe mark inspection allows for the assessment of probe card quality and the assurance of probe mark qualityDocuments
No documents
TEL / TOKYO ELECTRON
PRECIO OCTO
Verified
CATEGORY
Probers
Last Verified: Over 60 days ago
Key Item Details
Condition:
Used
Operational Status:
Unknown
Product ID:
85084
Wafer Sizes:
6"/150mm, 8"/200mm
Vintage:
2016
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
Similar Listings
View AllTEL / TOKYO ELECTRON
PRECIO OCTO
CATEGORY
Probers
Last Verified: Over 60 days ago
Key Item Details
Condition:
Used
Operational Status:
Unknown
Product ID:
85084
Wafer Sizes:
6"/150mm, 8"/200mm
Vintage:
2016
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
Description
No descriptionConfiguration
Automatic frame prober Specification of wafer, 6-8" Thickness: 350-1000 um Die size: 350-75000 umOEM Model Description
Precio octo™ is an 8-inch wafer prober that dramatically increases productivity by using ultra-high-speed indexing and high-speed wafer exchange functions to reduce test costs and improve Cost of Ownership. The structure has been strengthened and major components and optics have been improved to reduce vibration, resulting in superior operation. Additionally, the installation of TELPADS™-I automatic probe mark inspection allows for the assessment of probe card quality and the assurance of probe mark qualityDocuments
No documents