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Description
No descriptionConfiguration
Karl Suss PM8 200mm Precision Manual Analytical Prober. The PM8 provides the stability and resolution required for precise probe positioning. Manual submicron semiconductor failure analysis and in-process testing probe station. Submicron precision and stability with a fine-glide chuck stage and 8 in. x 8 in. X-Y movement. As fast as a motorized stage but with the simplicity and resolution of a manual system. Vacuum Chuck: 8 in. dia. Mitutoyo high magnification microscope with two long working distance objectives. Microscope lifts for easier access to the probes and device under test. Platen accepts vacuum base probe manipulators only.OEM Model Description
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PREFERRED
SELLER
Verified
CATEGORY
Probers
Last Verified: Over 60 days ago
Buyer pays 12% premium of final sale price
Key Item Details
Condition:
Used
Operational Status:
Unknown
Product ID:
13673
Wafer Sizes:
Unknown
Vintage:
Unknown
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
PREFERRED
SELLER
SUSS MicroTec / KARL SUSS
PM8
CATEGORY
Probers
Last Verified: Over 60 days ago
Buyer pays 12% premium of final sale price
Key Item Details
Condition:
Used
Operational Status:
Unknown
Product ID:
13673
Wafer Sizes:
Unknown
Vintage:
Unknown
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
Description
No descriptionConfiguration
Karl Suss PM8 200mm Precision Manual Analytical Prober. The PM8 provides the stability and resolution required for precise probe positioning. Manual submicron semiconductor failure analysis and in-process testing probe station. Submicron precision and stability with a fine-glide chuck stage and 8 in. x 8 in. X-Y movement. As fast as a motorized stage but with the simplicity and resolution of a manual system. Vacuum Chuck: 8 in. dia. Mitutoyo high magnification microscope with two long working distance objectives. Microscope lifts for easier access to the probes and device under test. Platen accepts vacuum base probe manipulators only.OEM Model Description
None ProvidedDocuments
No documents