
Description
Automated station for probe / test whole wafers / devices. Requires probe cards for specific device under test. Has feature recognition for auto align. Camera missing. Operated when last used 2019. Very configurable.Configuration
Type: 4 inch 6 inch capacity Additional: Programmable enclosure for CDA/N2 Accessories: Control CabinetOEM Model Description
The 2000 Series consists of the 2001CX Base Prober, the 2001CX Automatic Prober and the 2010CX Automatic Prober. The flexibility and upgradability inherent in the modular design concept of the 2000 Series is intended to provide a cost effective solution for all production environments by extending the operating life of the product.Documents
No documents
Verified
CATEGORY
Probers
Last Verified: 14 days ago
Key Item Details
Condition:
Used
Operational Status:
Installed / Running
Product ID:
142481
Wafer Sizes:
4"/100mm, 6"/150mm
Vintage:
Unknown
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
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2001CX
CATEGORY
Probers
Last Verified: 14 days ago
Key Item Details
Condition:
Used
Operational Status:
Installed / Running
Product ID:
142481
Wafer Sizes:
4"/100mm, 6"/150mm
Vintage:
Unknown
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
Description
Automated station for probe / test whole wafers / devices. Requires probe cards for specific device under test. Has feature recognition for auto align. Camera missing. Operated when last used 2019. Very configurable.Configuration
Type: 4 inch 6 inch capacity Additional: Programmable enclosure for CDA/N2 Accessories: Control CabinetOEM Model Description
The 2000 Series consists of the 2001CX Base Prober, the 2001CX Automatic Prober and the 2010CX Automatic Prober. The flexibility and upgradability inherent in the modular design concept of the 2000 Series is intended to provide a cost effective solution for all production environments by extending the operating life of the product.Documents
No documents